scanning electron micrograph中文是什么意思

發(fā)音:

中文翻譯
造句

【物理學(xué)】掃描電子顯微照相。

scanning n. 1.細(xì)看，細(xì)察，審視。 2.【電視】掃描，掃掠,搜 ...
electron n. 【物理學(xué)】電子。 the electron bea ...
micrograph n. 微寫器；【物理學(xué)】微動擴大測定器；顯微(鏡)制圖[ ...
electron scanning micrograph 電子掃描顯微鏡照片; 電子掃描顯微照片; 掃描電子顯微照片
scanning micrograph 掃描顯微圖象; 掃描顯微照片
electron micrograph 電鏡照片; 電子微動描記器; 電子微寫器; 電子顯微鏡檢查，電子顯微照片; 電子顯微鏡相片; 電子顯微鏡照片; 電子顯微鏡照相; 電子顯微圖; 電子顯微照相
electron probe micrograph 電子探針顯微照片
sca ing electron micrograph 掃描電子放大器
electron scanning 電子掃描
micrograph n. 微寫器；【物理學(xué)】微動擴大測定器；顯微(鏡)制圖[照相、照片]。
auger scanning electron microscope 離子槍式掃描電子顯微鏡
biological scanning electron microscope 生物掃描電子顯微鏡
dynamic scanning electron microscope 動態(tài)掃描電子顯微術(shù)
electron beam scanning 電子束掃描
electron beam scanning system 電子束掃描系統(tǒng)
electron scanning beam 掃描電子束
electron scanning microscope 電子掃描顯微鏡
electron scanning microscopy 掃描電子顯微術(shù)
electron scanning pupillometer 電子掃描式瞳孔計
electron-beam scanning system 電子束掃描系統(tǒng)
popular scanning electron microscope 普及型掃描電子顯微鏡
scanning auger electron microscope 掃描型奧格電子顯微鏡
scanning auger electron spectroscopy 掃描俄歇電子能譜學(xué)
scanning electron beam 掃描電子束
scanning electron beam lithography 掃描式電子束刻蝕

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例句與用法

Scanning electron micrograph
掃描電子放大器
This colorized scanning electron micrograph shows pollens ? bermuda grass in green , maple in red , and rag weed in yellow ? at roughly 3 , 000 times their itchy , sneezy life size
這是彩色掃描電子顯微圖，上面顯示的是各種花粉，綠色的是百慕大草，紅色的是楓木，黃色的是雜草。大概放大到了它們自身的3000倍，跟人的噴嚏一樣大！
Based on analyzing data from thin section , scanning electron micrograph and mercury injection , using nuclear magnetic resonance ( nmr ) , rock - electr experiment and numerical simulation techniquess , etc . to analyze main origin of complex oil and water zones
摘要在對薄片、掃描電鏡、壓汞資料分析基礎(chǔ)上，采用核磁共振、巖電實驗和數(shù)值模擬等手段，分析研究了復(fù)雜油水層的主要成因。
By analyzing the microstructure of as - cast alloys with different surplus of samarium added , the optimum surplus of samarium is decided . by comparing the microstructure of the alloys annealed for different time , the ideal and economical annealing time is confirmed . the microstructure and phase composition of alloys during the whole preparation of sm2fe17nx are analyzed using the scanning electron micrograph with energy - dispersive x - ray analysis and x - ray diffraction patterns
本論文首先就熔煉工藝參數(shù)對鑄態(tài)組織微結(jié)構(gòu)的影響進行了探討，并制定出一套較為合適的熔煉工藝；通過對不同釤加入量的鑄態(tài)組織微觀結(jié)構(gòu)的觀察分析，確定了原料配置過程中釤的最佳補償量；通過對采用不同退火時間的合金組織進行比較，確定了理想、經(jīng)濟的退火時間；同時還利用掃描電子顯微圖像和x射線衍射圖譜，比較了整個制備過程中，試樣微結(jié)構(gòu)和相組成的變化情況。
The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance , the breakdown field strength and dielectric properties were evaluated using high resistance meter , voltage resistance meter and precision impedance analyzer respectively
采用x射線衍射儀( xrd )對表面絕緣薄膜的物相組成進行了分析,掃描電子顯微鏡( sem )對表面絕緣薄膜的微觀結(jié)構(gòu)進行了研究,并用絕緣電阻測試儀、耐壓測試儀和精密阻抗分析儀分別對絕緣膜進行絕緣電阻率、擊穿場強和介電性能的測試。
The dependence of oxygen precipitation and induced - defects in heavily as - doped silicon on heat treatment process was studied by annealing and ig process , chemical etching , scanning electron micrograph ( sem ) and transmission electron microscopy ( tem ) . a developed ig technique was suggested and the mechanism of the influence of as on oxygen precipitation formation in heavily as - doped silicon was discussed
本文通過化學(xué)腐蝕、光學(xué)顯微鏡、掃描電鏡( sem ) 、透射電境( tem )等分析技術(shù)，對重?fù)缴楣鑶尉г趩尾酵嘶鸸に嚭蛢?nèi)吸雜退火工藝中氧沉淀及誘生缺陷的形態(tài)，形核與熱處理溫度、時間的關(guān)系等進行了研究。
The fabrication parameters were preliminarily optimized . the morphology and composition of the samples of the diamond film for different b / c ratios was investigated by scanning electron micrograph ( sem ) and raman scattering spectroscopy ( raman ) . the content of different levels of b dopant in the diamond film was tested by secondary ion mass spectrometry ( sims )
闡述了摻硼金剛石膜的制備工藝，研究了摻硼金剛石膜成核和生長的影響因素，初步優(yōu)化了沉積摻硼金剛石膜工藝參數(shù)，同時對摻硼金剛石膜進行了掃描分析、拉曼分析、二次離子質(zhì)譜分析和電阻率測試。

其他語種釋義

scanning electron micrographとは意味：走査電子顕微鏡寫真｛そうさでんしけんびきょうしゃしん｝

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